DocumentCode :
2129352
Title :
Micro-devices based on spectrum shape deformation
Author :
Enguang, Dai
Author_Institution :
Key Lab. for the Phys. & Chem. of Nanodevices, Peking Univ., Beijing, China
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
236
Lastpage :
239
Abstract :
Traditionally, resonate device related sensors are mainly for the detection of resonate peak shift resulting from outer environment disturbance. Besides, there are other types of sensors based upon the peak position detection as well. Electrical frequency spectrum shape or optical spectrum shape deformation are seldom employed as measurand. A new point of view on sensors will be demonstrated both in electrical domain and in optical domain. Different from the detection of the resonate peak, spectrum shape monitoring can provide us with different information.
Keywords :
deformation; micromechanical devices; sensors; electrical frequency spectrum shape deformation; micro-device; optical spectrum shape deformation; peak position detection; resonate peak shift;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
ISSN :
1930-0395
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2010.5690461
Filename :
5690461
Link To Document :
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