Title :
High value resistance standards at ETL
Author :
Kinoshita, J. ; Nakanishi, M.
Author_Institution :
Electrotech. Lab., Ibaraki, Japan
Abstract :
High value resistance standards has been established at ETL. Precision programmable voltage sources are used as ratio arm of bridge. Resistive network has been made in order to calibrate the ratio of output voltage of programmable voltage sources.
Keywords :
bridge instruments; calibration; electric resistance measurement; measurement standards; resistors; 1 Mohm; 1 Tohm; ETL; bridge; high value resistor; programmable voltage sources; ratio arm; resistance bridge; resistance standards; resistive network; up to 1 T/spl Omega/; voltage ratio calibration; Bridge circuits; Calibration; Detectors; Electrical resistance measurement; Impedance; Laboratories; Leakage current; Resistors; Temperature; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.850992
