• DocumentCode
    2130237
  • Title

    Novel measurement system within 110-170 GHz using a dielectric multistate refiectometer

  • Author

    Boese, I M ; Collier, R.J.

  • Author_Institution
    The Electronic Engineering Laboratory, University of Kent, Canterbury, Kent CT2 7NT.
  • Volume
    2
  • fYear
    1996
  • fDate
    6-13 Sept. 1996
  • Firstpage
    806
  • Lastpage
    810
  • Abstract
    The paper will describe a novel measurement system which is part of a research project on the design of M3ICs at 140 GHz. The intension is to characterise on-wafer devices within the waveguide band 110 - 170 GHz using a dielectric waveguide multistate reflectometer (DMR). Although a lot of work has been done in recent years on realising 6 port and then 4 port reflectometers they either were built for frequency ranges below 100 GHz or they were realised using metallic waveguide technology.
  • Keywords
    Detectors; Dielectric measurements; Frequency; Hardware; Microwave oscillators; Phase measurement; Power measurement; Reflection; Switches; Waveguide components;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1996. 26th European
  • Conference_Location
    Prague, Czech Republic
  • Type

    conf

  • DOI
    10.1109/EUMA.1996.337701
  • Filename
    4138750