Title :
Development and evaluation of a high resolution measuring system for a switching impulse measurement
Author :
Hong Tang ; Bergman, A.
Author_Institution :
Swedish Nat. Testing & Res. Inst., Boras, Sweden
Abstract :
This paper describes development and evaluation of a high accuracy high voltage measuring system for switching impulse. The noise level is less than 0.05%, the estimated uncertainties for the peak value measurement are better than +0.1%; for the time parameter measurement better than +1%.
Keywords :
impulse testing; measurement standards; voltage measurement; estimated uncertainties; high resolution measuring system; high voltage measuring system; noise level; peak value measurement; switching impulse measurement; time parameter measurement; Capacitors; Circuits; Frequency measurement; Impulse testing; Low voltage; Pulse measurements; Resistors; System testing; Temperature; Time measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851022
