• DocumentCode
    2130272
  • Title

    Development and evaluation of a high resolution measuring system for a switching impulse measurement

  • Author

    Hong Tang ; Bergman, A.

  • Author_Institution
    Swedish Nat. Testing & Res. Inst., Boras, Sweden
  • fYear
    2000
  • fDate
    14-19 May 2000
  • Firstpage
    355
  • Lastpage
    356
  • Abstract
    This paper describes development and evaluation of a high accuracy high voltage measuring system for switching impulse. The noise level is less than 0.05%, the estimated uncertainties for the peak value measurement are better than +0.1%; for the time parameter measurement better than +1%.
  • Keywords
    impulse testing; measurement standards; voltage measurement; estimated uncertainties; high resolution measuring system; high voltage measuring system; noise level; peak value measurement; switching impulse measurement; time parameter measurement; Capacitors; Circuits; Frequency measurement; Impulse testing; Low voltage; Pulse measurements; Resistors; System testing; Temperature; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2000 Conference on
  • Conference_Location
    Sydney, NSW, Australia
  • Print_ISBN
    0-7803-5744-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2000.851022
  • Filename
    851022
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2130272