Title :
Least-squares fitting of the current drift for a DVM-based comparison method
Author :
de Aguilar, J.D. ; Zorzano, R. ; Rodriguez, M.
Author_Institution :
DC & LF Standards Lab., Madrid, Spain
Abstract :
A method to compensate the variations in the current source using least-squares fitting and its application to the DVM-based comparison method is described. The algorithm allows for nonlinear variations in the current source, and makes it possible to perform measurement series with no need of constant time intervals between them.
Keywords :
digital voltmeters; electric resistance measurement; least squares approximations; measurement standards; measurement uncertainty; DVM-based comparison method; compensation method; current drift; current source; least-squares fitting; linear nine-equation system; nonlinear variations; relative uncertainty; resistance standards; series-connected resistances; voltages comparison; Current measurement; Electrical resistance measurement; Equations; Laboratories; Measurement standards; Performance evaluation; Radio frequency; Thermal resistance; Time measurement; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851030
