• DocumentCode
    2130495
  • Title

    High Granularity Remote Sensing and Crop Production over Space and Time: NDVI over the Growing Season and Prediction of Cotton Yields at the Farm Field Level in Texas

  • Author

    Little, Bert ; Schucking, Michael ; Gartrell, Brandon ; Chen, Bing ; Ross, Kenton ; McKellip, Rodney

  • Author_Institution
    Depts. of Math & of Phys. & Eng., Tarleton State Univ., Stephenville, TX
  • fYear
    2008
  • fDate
    15-19 Dec. 2008
  • Firstpage
    426
  • Lastpage
    435
  • Abstract
    Remote sensing has been applied to agriculture at very coarse levels of granularity (i.e., national levels) but few investigations have focused on yield prediction at the farm unit level. Specific aims of the present investigation are to analyze the ability of Moderate Resolution Imaging Spectroradiometer (MODIS) data to predict cotton yields in two highly homogeneous counties in west Texas. In one study county > 90% of cotton grown is irrigated, while the other study county 40 miles south has >85% non-irrigated cotton. Regression analysis by day from April to November at the county and farm levels reveals a highly significant ability for MODIS to predict cotton yields. R values ranged from 0.90 to 0.98 for irrigated cotton and 0.80 to . 90 for non-irrigated cotton practices. The objective in future studies is to algorithmically extend these analyses to the ~300 million acres of arable land under cultivation in the United States.
  • Keywords
    agriculture; cotton; crops; data mining; remote sensing; Texas; United States; cotton yields; crop production; farm field level; growing season; high granularity remote sensing; moderate resolution imaging spectroradiometer data; regression analysis; yield prediction; Africa; Agriculture; Asia; Cotton; Crops; Data mining; MODIS; Production; Remote sensing; Satellites; Cotton Yield Prediction; Farm Field; High Granularity; NDVI; Remote Sensing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining Workshops, 2008. ICDMW '08. IEEE International Conference on
  • Conference_Location
    Pisa
  • Print_ISBN
    978-0-7695-3503-6
  • Electronic_ISBN
    978-0-7695-3503-6
  • Type

    conf

  • DOI
    10.1109/ICDMW.2008.91
  • Filename
    4733965