Title :
Broadband GaN Dual-Gate HEMT Low Noise Amplifier
Author :
Shih, S.E. ; Deal, W.R. ; Sutton, W.E. ; Chen, Y.C. ; Smorchkova, I. ; Heying, B. ; Wojtowicz, M. ; Siddiqui, M.
Author_Institution :
Northrop Grumman Space Technol., Redondo Beach
Abstract :
This paper presents a broadband low noise amplifier MMIC utilizing 0.2 urn AlGaN/GaN HEMT technology. The single-stage, resistive feedback amplifier is designed in co-planar waveguide (CPW) topology. It uses dual-gate devices with on-chip drain bias network to achieve 18 dB flat gain between 300 MHz -4 GHz. Measured noise figure is around 1.5 dB between 2 and 5 GHz, and better than 2 dB between 1 and 2 GHz. The amplifier is capable of 25 dBm saturated output power with 1 dB compression point around 20 dBm across the band. Due to high breakdown voltage of GaN devices, the LNA can withstand high input power and shows no sign of degradation.
Keywords :
III-V semiconductors; MMIC amplifiers; aluminium compounds; coplanar waveguides; feedback amplifiers; gallium compounds; high electron mobility transistors; low noise amplifiers; wide band gap semiconductors; wideband amplifiers; AlGaN-GaN; HEMT low noise amplifier; broadband low noise amplifier MMIC; coplanar waveguide topology; feedback amplifier; frequency 300 MHz to 4 GHz; size 0.2 mum; Aluminum gallium nitride; Broadband amplifiers; Coplanar waveguides; Feedback amplifiers; Gallium nitride; HEMTs; Low-noise amplifiers; MMICs; Network topology; Power amplifiers;
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium, 2007. CSIC 2007. IEEE
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-1022-4
DOI :
10.1109/CSICS07.2007.26