DocumentCode :
2130719
Title :
HEMTs extrinsic noise model for millimeter waves integrated circuits design
Author :
Belquin, J.M. ; Danneville, F. ; Cappy, A. ; Dambrine, G.
Author_Institution :
Institut d´´Electronique et de microelectronique, du Nord (IEMN), UMR CNRS N° 9929, Avenue Poincare, BP 69, 59652 Villeneuve d´´Ascq CEDEX. Tel: (33)20 19 78 62, Fax: (33)20 19 78 92, E-Mail: Jean-Maxence.Belquin@iemn.univ-Lillel.fr
Volume :
2
fYear :
1996
fDate :
6-13 Sept. 1996
Firstpage :
900
Lastpage :
902
Abstract :
We present a new model to determine the noise performances of HEMTs in the millimeter wave range from characterizations below 40 GHz. This work describes an extrinsic noise model based on two equivalent noise temperatures (Tin and Tout) both independent from frequency and gate width. This extrinsic noise model is well suited for right first time mm-wave circuit design. The main reason is that only two parasitic (Lg and Cpg) have to be accurately determined. Then the determination of the equivalent temperatures Tin and Tout is less sensitive to measurements uncertainties and parasitic extraction than conventional two temperatures intrinsic noise model.
Keywords :
Circuit synthesis; Frequency; HEMTs; Integrated circuit modeling; Integrated circuit noise; Integrated circuit synthesis; MODFETs; Millimeter wave integrated circuits; Temperature sensors; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1996. 26th European
Conference_Location :
Prague, Czech Republic
Type :
conf
DOI :
10.1109/EUMA.1996.337721
Filename :
4138770
Link To Document :
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