• DocumentCode
    2130719
  • Title

    HEMTs extrinsic noise model for millimeter waves integrated circuits design

  • Author

    Belquin, J.M. ; Danneville, F. ; Cappy, A. ; Dambrine, G.

  • Author_Institution
    Institut d´´Electronique et de microelectronique, du Nord (IEMN), UMR CNRS N° 9929, Avenue Poincare, BP 69, 59652 Villeneuve d´´Ascq CEDEX. Tel: (33)20 19 78 62, Fax: (33)20 19 78 92, E-Mail: Jean-Maxence.Belquin@iemn.univ-Lillel.fr
  • Volume
    2
  • fYear
    1996
  • fDate
    6-13 Sept. 1996
  • Firstpage
    900
  • Lastpage
    902
  • Abstract
    We present a new model to determine the noise performances of HEMTs in the millimeter wave range from characterizations below 40 GHz. This work describes an extrinsic noise model based on two equivalent noise temperatures (Tin and Tout) both independent from frequency and gate width. This extrinsic noise model is well suited for right first time mm-wave circuit design. The main reason is that only two parasitic (Lg and Cpg) have to be accurately determined. Then the determination of the equivalent temperatures Tin and Tout is less sensitive to measurements uncertainties and parasitic extraction than conventional two temperatures intrinsic noise model.
  • Keywords
    Circuit synthesis; Frequency; HEMTs; Integrated circuit modeling; Integrated circuit noise; Integrated circuit synthesis; MODFETs; Millimeter wave integrated circuits; Temperature sensors; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1996. 26th European
  • Conference_Location
    Prague, Czech Republic
  • Type

    conf

  • DOI
    10.1109/EUMA.1996.337721
  • Filename
    4138770