DocumentCode
2130719
Title
HEMTs extrinsic noise model for millimeter waves integrated circuits design
Author
Belquin, J.M. ; Danneville, F. ; Cappy, A. ; Dambrine, G.
Author_Institution
Institut d´´Electronique et de microelectronique, du Nord (IEMN), UMR CNRS N° 9929, Avenue Poincare, BP 69, 59652 Villeneuve d´´Ascq CEDEX. Tel: (33)20 19 78 62, Fax: (33)20 19 78 92, E-Mail: Jean-Maxence.Belquin@iemn.univ-Lillel.fr
Volume
2
fYear
1996
fDate
6-13 Sept. 1996
Firstpage
900
Lastpage
902
Abstract
We present a new model to determine the noise performances of HEMTs in the millimeter wave range from characterizations below 40 GHz. This work describes an extrinsic noise model based on two equivalent noise temperatures (Tin and Tout) both independent from frequency and gate width. This extrinsic noise model is well suited for right first time mm-wave circuit design. The main reason is that only two parasitic (Lg and Cpg) have to be accurately determined. Then the determination of the equivalent temperatures Tin and Tout is less sensitive to measurements uncertainties and parasitic extraction than conventional two temperatures intrinsic noise model.
Keywords
Circuit synthesis; Frequency; HEMTs; Integrated circuit modeling; Integrated circuit noise; Integrated circuit synthesis; MODFETs; Millimeter wave integrated circuits; Temperature sensors; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1996. 26th European
Conference_Location
Prague, Czech Republic
Type
conf
DOI
10.1109/EUMA.1996.337721
Filename
4138770
Link To Document