Development of fast-switching Nb/Al/Nb SNS junctions for the AC Josephson voltage standard

Author

Lacquaniti, V. ; Maggi, S. ; Monticone, E. ; Polcari, A. ; Rocci, R. ; Steni, R. ; Andreone, D.

Author_Institution

Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy

fYear

2000

fDate

14-19 May 2000

Firstpage

397

Lastpage

398

Abstract

We report here the current development status of our Nb/Al/Nb SNS Josephson junctions for a programmable voltage standard. The morphology and the electrical parameters of these junctions are strongly dependent on the Al deposition rate. The RF and magnetic field behaviour is also reported, together with preliminary data about the uniformity and reproducibility of the series arrays made with this technology.

Keywords

Josephson effect; aluminum; critical currents; measurement standards; niobium; sputter deposition; superconducting arrays; superconductor-normal-superconductor devices; voltage measurement; AC Josephson voltage standard; Al deposition rate dependence; Nb-Al-Nb; RF behaviour; fast-switching Nb/Al/Nb SNS junctions; high critical currents; junction electrical parameters; junction morphology; magnetic field behaviour; programmable voltage standard; reproducibility; series arrays; sputter deposition; uniformity; Conductivity; Critical current; Frequency; Josephson junctions; Magnetic fields; Niobium; Reproducibility of results; Standards development; Superconducting device noise; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 2000 Conference on

Conference_Location

Sydney, NSW, Australia

Print_ISBN

0-7803-5744-2

Type

conf

DOI

10.1109/CPEM.2000.851043

Filename

851043