Title :
Measurement uncertainty in the 1/f noise region: Zener voltage standards
Author :
Helisto, P. ; Seppa, H. ; Rautiainen, A.
Author_Institution :
VTT Autom. Meas. Technol., Finland
Abstract :
The measurement uncertainty is studied in terms of the Allan variance when the uncertainty is limited by 1/f noise. The deadtime in measurements determines the time scale of best measurement uncertainty. About ten equally spaced samples seem to map the noise spectrum well enough and no uncertainty improvement results from further averaging. The voltage difference of two Zener standards in the frequency band 10/sup -6/-10/sup 3/ Hz was studied and closely 1/f behaviour was detected. The noise floor of one Zener is about 70 nV.
Keywords :
1/f noise; Zener diodes; measurement standards; measurement uncertainty; semiconductor device noise; voltage measurement; 1/f noise region; 1E-6 to 1E-3 Hz; Allan variance; Zener voltage standards; deadtime; measurement uncertainty; noise floor; noise spectrum; voltage difference; Fluctuations; Frequency measurement; Measurement standards; Measurement uncertainty; Metrology; Noise measurement; Testing; Time measurement; Voltage; White noise;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851045
