• DocumentCode
    2130798
  • Title

    Modeling approach for full-system design and rapid hardware prototyping of microelectromechanical systems

  • Author

    Khalilyulin, Ruslan ; Steinhuber, Thomas ; Reutter, Teresa ; Wachutka, Gerhard ; Schrag, Gabriele

  • Author_Institution
    Inst. for Phys. of Electrotechnol., Munich Univ. of Technol., Munich, Germany
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    1405
  • Lastpage
    1410
  • Abstract
    We present a modeling approach for the efficient full system design of MEMS. Our methodology is based on a hierarchical approach, which allows the derivation of predictive system-level models. This procedure starts with high-fidelity continuous-field simulations to determine all model parameters and their dependencies on external impacts followed by a proper experimental calibration of the models in order to adjust the deviations caused by manufacturing-induced fluctuations. In a second step, the physically-based high-level transducer model is connected to a FPGA board, on which the corresponding control algorithms are implemented. The advantage of these hardware/software co-simulations compared to "pure" simulations is a more realistic estimation of the overall performance of the control circuitry and its interplay with the transducer, even before it is realized in hardware. This allows for modifications and optimization of both, the control circuit and the transducer design, in a very early stage of the design process.
  • Keywords
    field programmable gate arrays; hardware-software codesign; micromechanical devices; transducers; FPGA board; MEMS; control algorithms; control circuitry; full-system design; hardware-software cosimulations; high-fidelity continuous-field simulations; manufacturing-induced fluctuations; microelectromechanical systems; physically-based high-level transducer model; predictive system-level models; rapid hardware prototyping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2010 IEEE
  • Conference_Location
    Kona, HI
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-8170-5
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2010.5690514
  • Filename
    5690514