Title :
Measurement uncertainties arising from unpowered shipment of DC voltage references
Author :
Christian, L.A. ; Chua, S.W. ; Sim, T.Y. ; Liu, L.X.
Author_Institution :
Ind. Res., Measurement Standards Lab. of New Zealand, Lower Hutt, New Zealand
Abstract :
Continuously powering the internal temperature-controlled oven provides best accuracy with Zener-diode-based DC voltage references. The hysteresis uncertainties arising from loss of power for two Fluke 732Bs are quantified. This establishes that these instruments can be shipped without battery power between national laboratories without adding significant uncertainty to a comparison.
Keywords :
Zener diodes; measurement standards; measurement uncertainty; voltage measurement; DC voltage reference; Fluke 732B; Zener diode; hysteresis; measurement uncertainty; temperature controlled oven; unpowered shipment; Batteries; Humidity; Hysteresis; Instruments; Laboratories; Measurement standards; Measurement uncertainty; Productivity; Temperature; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851046
