Title :
Applying humidity model to reduce uncertainty of voltage comparisons using Zener standards
Author :
Liu, L.X. ; Sim, T.Y. ; Tan, V.K.S. ; Chua, H.A. ; Chua, S.W.
Author_Institution :
Nat. Meas. Centre of Singapore Productivity & Standards Board, Singapore
Abstract :
Reported results describe the response of Zener-diode-based voltage standards under relative humidity changes, especially for 1.018 V output, approximately using the solution of a first-order differential equation. It is shown that incorporating a time-dependent humidity correction to the model can substantially reduce the residuals, and therefore the uncertainty, of an international comparison.
Keywords :
Zener diodes; humidity; measurement standards; measurement uncertainty; voltage measurement; 1.018 V; Zener diode; differential equation; international comparison; measurement uncertainty; relative humidity model; voltage standard; Differential equations; Humidity control; Humidity measurement; Laboratories; Measurement standards; Pressure measurement; Productivity; Temperature dependence; Uncertainty; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851048