Title :
Noise-source stability measurements
Author :
Randa, J. ; Dunleavy, L.P. ; Terrell, L.A.
Author_Institution :
RF Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We report results of stability tests on several noise sources for selected frequencies between 12 and 26.5 GHz. Measurements covered intervals of about 1 week and about 1 year or more. Drifts in noise temperature were typically less than the uncertainty of the tests, about 0.03% per day or about 0.05% per year for hot sources.
Keywords :
measurement standards; measurement uncertainty; microwave measurement; noise generators; stability; 1 week; 1 year; 12 to 26.5 GHz; check standards; noise sources; noise temperature; stability tests; uncertainty; Calibration; Diodes; Frequency; Gain measurement; NIST; Noise measurement; Radiometry; Stability; System testing; Temperature measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851067
