Frequency flicker limitation in dual oscillator phase noise measurement instruments

Author

Groslambert, J. ; Rubiola, Enrico ; Brunet, M. ; Giordano, V.

Author_Institution

Lab. de Phys. et Metrol. des Oscillateurs, CNRS, Besancon, France

fYear

2000

fDate

14-19 May 2000

Firstpage

449

Lastpage

450

Abstract

Dual oscillator phase noise test sets are based on a PLL. In order to pull the slave oscillator in the dynamic range of the control, a DC voltage must be added. In an automatic test set this voltage comes from a DAC. We demonstrate that the flicker noise of the DAC yields an additional frequency flicker of the instrument that is not detected with the usual calibration procedures. In some circumstances the DAC noise turns out to be the main factor limiting the instrument sensitivity at low Fourier frequencies.

Keywords

automatic test equipment; calibration; electric noise measurement; flicker noise; phase noise; Fourier frequencies; PLL; automatic test set; calibration procedures; dual oscillator phase noise measurement instruments; dynamic range; flicker noise; frequency flicker limitation; instrument sensitivity; slave oscillator; 1f noise; Dynamic range; Frequency; Instruments; Oscillators; Phase locked loops; Phase noise; Testing; Voltage control; Voltage fluctuations;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 2000 Conference on

Conference_Location

Sydney, NSW, Australia

Print_ISBN

0-7803-5744-2

Type

conf

DOI

10.1109/CPEM.2000.851069

Filename

851069