DocumentCode
2131844
Title
Elasticity of si calculated with a lattice dynamics model
Author
Zhang, Weiwei ; Huang, Qing-An ; Yu, Hong
Author_Institution
Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing, China
fYear
2010
fDate
1-4 Nov. 2010
Firstpage
1350
Lastpage
1353
Abstract
The traditional elastic theories based on the continuum assumptions may not be directly applicable for microsystems and nanosystems without any modification. In this paper, an augmented continuum theory, based on lattice dynamics theories, is developed to examine the elasticity of three-dimensional Si materials. The second-order elastic constants of Si can be expressed as the function of the force constants. A modified Keating model, as the interactional potential, includes four interactions, and needs four corresponding force constants. The phonon dispersion relations have been calculated by using the density functional perturbation theory, from which the force constants can be extracted and optimized. The calculated phonon spectra agrees well with experimental results, with the relative error ranging from 1.4% to 6.1%. Combining the modified Keating model with the phonon dispersion relations, the analytic expressions for certain high-symmetry k points phonon frequencies and the elastic constants of Si can be obtained. Then the Young´s modulus in <;100>;, <;110>; and <;111>; crystallographic directions have been calculated, and the average deviation is less than 3.8%. The approach is expected to be used in the nano silicon beam.
Keywords
Young´s modulus; density functional theory; elastic constants; elasticity; elemental semiconductors; perturbation theory; phonon dispersion relations; silicon; <;100>; crystallographic direction; <;110>; crystallographic direction; <;111>; crystallographic direction; Si; Young´s modulus; augmented continuum theory; density functional perturbation theory; elasticity; force constants; interactional potential; lattice dynamics model; modified Keating model; phonon dispersion relations; second-order elastic constants; three-dimensional materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2010 IEEE
Conference_Location
Kona, HI
ISSN
1930-0395
Print_ISBN
978-1-4244-8170-5
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2010.5690550
Filename
5690550
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