Title :
A W-band spectrometer for precision dielectric measurements
Author :
Afsar, M.N. ; Tkachov, I.I. ; Kocharyan, K.
Author_Institution :
Dept. of Electr. & Comput. Sci., Tufts Univ., Medford, MA, USA
Abstract :
A new spectrometer for the precision measurement of dielectric permittivity and loss tangent is presented. The new instrument is capable of providing the high resolution data for the first time over an extended W-band (68-118 GHz) frequencies for specimens with large range of absorption values, including highly absorbing specimens which otherwise would not be possible. A novel technique based on the unbalanced bridge is developed for the measurement of the phase of the wave passed through the specimen in free space (quasi-optical) with reference provided by a waveguide arm. Specially constructed precision waveguide and quasi-optical components allowed reliable broad band operation. A number of common dielectrics are measured and results are compared with previously reported data.
Keywords :
dielectric loss measurement; millimeter wave measurement; permittivity measurement; radiofrequency spectrometers; 68 to 118 GHz; EHF; W-band spectrometer; dielectric permittivity; high resolution data; highly absorbing specimens; loss tangent; phase measurement; precision dielectric measurements; precision quasi-optical component; precision waveguide components; reliable broadband operation; unbalanced bridge; waveguide arm reference; Absorption; Bridges; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency; Instruments; Loss measurement; Permittivity measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851102