DocumentCode :
2132337
Title :
Determining the number of sources in high-density EEG recordings of event-related potentials by model order selection
Author :
Cong, Fengyu ; He, Zhaoshui ; Hämäläinen, Jarmo ; Cichocki, Andrzej ; Ristaniemi, Tapani
Author_Institution :
Dept. of Math. Inf. Technol., Univ. of Jyvaskyla, Jyvaskyla, Finland
fYear :
2011
fDate :
18-21 Sept. 2011
Firstpage :
1
Lastpage :
6
Abstract :
To high-density electroencephalography (EEG) recordings, determining the number of sources to separate the signal and the noise subspace is very important. A mostly used criterion is that percentage of variance of raw data explained by the selected principal components composing the signal space should be over 90%. Recently, a model order selection method named as GAP has been proposed. We investigated the two methods by performing independent component analysis (ICA) on the estimated signal subspace, assuming the number of selected principal components composing the signal subspace is equal to the number of sources of brain activities. Through examining wavelet-filtered EEG recordings (128 electrodes) of ERPs, ICA with the reference to GAP decomposed 14 selected principal components reliably into 14 independent components, and ICA decomposition with the variance explained method was not reliable, indicating that the number of sources, as well as the signal subspace, should be well estimated through GAP.
Keywords :
bioelectric potentials; electroencephalography; filtering theory; independent component analysis; medical signal processing; principal component analysis; wavelet transforms; ERP; GAP; ICA decomposition; brain activity; estimated signal subspace; event-related potentials; high-density EEG recordings; high-density electroencephalography recordings; independent component analysis; model order selection method; noise subspace; principal components; signal space; variance explained method; wavelet-filtered EEG recordings; Brain modeling; Eigenvalues and eigenfunctions; Electrodes; Electroencephalography; Noise; Principal component analysis; Reliability; Event-related potential; independent/principal component analysis; model order selection; number of sources; reliability; wavelet filter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Machine Learning for Signal Processing (MLSP), 2011 IEEE International Workshop on
Conference_Location :
Santander
ISSN :
1551-2541
Print_ISBN :
978-1-4577-1621-8
Electronic_ISBN :
1551-2541
Type :
conf
DOI :
10.1109/MLSP.2011.6064590
Filename :
6064590
Link To Document :
بازگشت