Title :
Proposal of a test method for the linearity of the QHR
Author_Institution :
Fac. of Eng., Tamagawa Univ., Tokyo, Japan
Abstract :
Linearity test of I-V characteristic for QHR device at i=2 and i=4 has been performed by the dual frequency method for the purpose of linear resistor standard.
Keywords :
electric resistance measurement; measurement standards; measurement uncertainty; nonlinear distortion; quantum Hall effect; resistors; 12.9 kohm; 6.4 kohm; I-V characteristic; QHE resistance standard; differential resistance; dual frequency method; linear resistor standard; linearity test method; noise level; nonlinear distortion voltage; quantum Hall resistance; Distortion measurement; Electrical resistance measurement; Frequency; Linearity; Magnetic field measurement; Nonlinear distortion; Proposals; Resistors; Testing; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851133
