• DocumentCode
    2132982
  • Title

    Single electron transistor with two gate inputs

  • Author

    Fukushima, A. ; Iwasa, A. ; Sato, A.

  • Author_Institution
    Electrotech. Lab., Ibaraki, Japan
  • fYear
    2000
  • fDate
    14-19 May 2000
  • Firstpage
    591
  • Lastpage
    592
  • Abstract
    We fabricate a single electron tunneling (SET) transister, and add an extra electrode covering the whole surface. This extra electrode works well as another gate input with the effective gate capacitance of 2 aF, which is 1/80 of that of the on-chip gate (0.16 fF). Compared with the noises under the operation by the two gate input, it is found that the SET transistor with the extra gate operation becomes noisy more than one order of magnitude of that with the on-chip gate.
  • Keywords
    semiconductor device noise; single electron transistors; dual gate electrode device; gate capacitance; noise; single electron transistor; single electron tunneling; Capacitance; Electrodes; Electron beams; Laboratories; Lithography; Refrigeration; Single electron transistors; Temperature sensors; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2000 Conference on
  • Conference_Location
    Sydney, NSW, Australia
  • Print_ISBN
    0-7803-5744-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2000.851148
  • Filename
    851148