Title :
Metrological quality of measured and evaluated values using automated measuring systems
Author_Institution :
Inst. Superior Tecnico, Tech. Univ. Lisbon, Portugal
Abstract :
The present paper addresses issues related with the metrological performance of automated measuring systems (AMSs) and points out some possibilities opened in that domain by the increased ease of use and measurement throughput of such systems over nonautomated ones.
Keywords :
computerised instrumentation; measurement theory; measurement uncertainty; automated measuring systems; evaluated values; measured values; measurement throughput; metrological performance; metrological quality; Electric variables measurement; Humans; Laboratories; Law; Metrology; Particle measurements; Software measurement; Telecommunications; Throughput; Uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851155
