• DocumentCode
    2133526
  • Title

    Towards traceability of the direct calibration method to the cal kit standards

  • Author

    Rodriguez, M.

  • Author_Institution
    INTA, Madrid, Spain
  • fYear
    2000
  • fDate
    14-19 May 2000
  • Firstpage
    636
  • Lastpage
    637
  • Abstract
    The Direct Calibration Method for characterisation of three-port devices is presented. Formulas for derivation of the measurement uncertainty are provided, which relate the DUT parameters to the characterisation of the calibration standards. Traceability is obtained from a certificate of calibration or, alternatively, from the manufacturer´s specifications.
  • Keywords
    calibration; measurement standards; measurement uncertainty; microwave measurement; DUT parameters; calibration kit standards; certificate; direct calibration; manufacturer specifications; measurement uncertainty; three-port devices; traceability; vector network analyser; Calibration; Capacitance; Delay; Impedance; Measurement standards; Measurement uncertainty; Performance evaluation; Power measurement; Reflection; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2000 Conference on
  • Conference_Location
    Sydney, NSW, Australia
  • Print_ISBN
    0-7803-5744-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2000.851172
  • Filename
    851172