Title :
Towards traceability of the direct calibration method to the cal kit standards
Author_Institution :
INTA, Madrid, Spain
Abstract :
The Direct Calibration Method for characterisation of three-port devices is presented. Formulas for derivation of the measurement uncertainty are provided, which relate the DUT parameters to the characterisation of the calibration standards. Traceability is obtained from a certificate of calibration or, alternatively, from the manufacturer´s specifications.
Keywords :
calibration; measurement standards; measurement uncertainty; microwave measurement; DUT parameters; calibration kit standards; certificate; direct calibration; manufacturer specifications; measurement uncertainty; three-port devices; traceability; vector network analyser; Calibration; Capacitance; Delay; Impedance; Measurement standards; Measurement uncertainty; Performance evaluation; Power measurement; Reflection; Testing;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851172
