Title :
Fast multi-class sample reduction for speeding up support vector machines
Author :
Chen, Jingnian ; Liu, Cheng-Lin
Author_Institution :
Nat. Lab. of Pattern Recognition, Beijing, China
Abstract :
Despite the superior classification performance of support vector machines (SVMs), training SVMs on large datasets is still a challenging problem. Sample reduction methods have been proposed and shown to reduce the training complexity significantly, but more or less trade off the generalization performance. This paper presents an efficient sample reduction method for multi-class classification using one-vs-rest SVMs, called Multi-class Sample Selection (MUSS). For each binary one-vs-rest classification problem, positive samples and negative samples are selected based on the distances from the cluster centers of positive class, assuming that positive samples with large distances from the positive centers and negative samples with small distances from the positive centers are near the classification boundary. The intention of clustering is to improve the computation efficiency of sample selection, other than to select from cluster centers as previous methods did. Experiments on a wide variety of datasets demonstrate the superiority of the proposed MUSS over other competitive algorithms in respect of the tradeoff between reduced sample size and classification performance. The experimental results show that MUSS also works well for binary classification problems.
Keywords :
generalisation (artificial intelligence); pattern classification; pattern clustering; support vector machines; binary one-vs-rest classification problem; cluster centers; competitive algorithms; fast multiclass sample reduction methods; multiclass classification; multiclass sample selection; support vector machines; training complexity; Accuracy; Algorithm design and analysis; Clustering algorithms; Complexity theory; Glass; Support vector machines; Training; Clustering; Multi-class classification; SVM; Sample selection;
Conference_Titel :
Machine Learning for Signal Processing (MLSP), 2011 IEEE International Workshop on
Conference_Location :
Santander
Print_ISBN :
978-1-4577-1621-8
Electronic_ISBN :
1551-2541
DOI :
10.1109/MLSP.2011.6064636