DocumentCode
2133867
Title
Using the Allan variance and power spectral density to characterize dc nanovoltmeters
Author
Witt, T.J.
Author_Institution
Bur. Int. des Poids et Mesures, Sevres, France
fYear
2000
fDate
14-19 May 2000
Firstpage
667
Lastpage
668
Abstract
Stochastic serial correlations in nanovoltmeter data are often ignored and the experimental standard deviation divided by the square root of the number of observations is incorrectly used to describe the scatter. This paper demonstrates the use of power spectra and the Allan variance to characterize the performance of digital and analog DC nanovoltmeters.
Keywords
correlation methods; data analysis; measurement standards; measurement uncertainty; spectral analysis; stochastic systems; voltage measurement; voltmeters; Allan variance; analog DC nanovoltmeters; digital DC nanovoltmeters; experimental standard deviation; power spectra; power spectral density; scatter; square root; stochastic serial correlation; Analysis of variance; Filters; Measurement standards; Metrology; Noise measurement; Scattering; Stochastic processes; Time measurement; Voltage measurement; White noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location
Sydney, NSW, Australia
Print_ISBN
0-7803-5744-2
Type
conf
DOI
10.1109/CPEM.2000.851188
Filename
851188
Link To Document