• DocumentCode
    2133932
  • Title

    Thermal Performance Comparison between Various RF Transceiver Modules

  • Author

    Chiriac, Victor Adrian ; Lee, Tien-Yu Tom

  • Author_Institution
    Adv. Packaging & Syst. Integration, Freescale Semicond. Inc., Temne, AZ
  • fYear
    2006
  • fDate
    May 30 2006-June 2 2006
  • Firstpage
    274
  • Lastpage
    280
  • Abstract
    A detailed numerical study was conducted to investigate the thermal behavior of three RF transceiver modules in a custom environment. The system incorporates the transceiver device and the high density interconnects (HDI) substrate at a fixed boundary condition. In general, the transceiver module requires lesser heat dissipation and thermal requirement may not be as critical as for the power amplifier (PA) module. However, its low thermally conductive die attach material, reduced size of the active areas (micron range) and fairly high power densities lead to the concern that the thermal budget (150 degC) may be exceeded under the various operating scenarios. Each transceiver module was modeled in detail including the device local discrete heat sources, the substrate metal layers, and micro and buried vias distribution across the dielectric layers. The impact of via locations in the substrate is also examined to address the die reliability issues. Results indicated that due to the low power dissipation, the predicted peak temperatures of all three Transceiver modules are below the 150 degC thermal budget. Analyses also suggest that the vias located directly under the die could be removed without any significant thermal penalty. Also, by strategically placing a few vias near the heat sources while removing rest of them in the substrate; it will still satisfy the overall thermal requirements. A detailed comparison between various transceiver designs and associated thermal performance is provided
  • Keywords
    interconnections; microassembling; reliability; thermal management (packaging); transceivers; CFD; HDI; PA module; RF transceiver modules; die attach material; die reliability; dielectric layers; discrete heat sources; fixed boundary condition; high density interconnects; low thermal conductive material; power amplifier module; substrate metal layers; thermal budget; thermal performance; Boundary conditions; Conducting materials; Dielectric substrates; Microassembly; Power amplifiers; Power system interconnection; Radio frequency; Radiofrequency amplifiers; Thermal conductivity; Transceivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    0-7803-9524-7
  • Type

    conf

  • DOI
    10.1109/ITHERM.2006.1645353
  • Filename
    1645353