Title :
Susceptibility Analysis of Arbitrarily Shaped 2-D Dielectric Screens using the Generalized Scattering Matrix Method
Author :
Balbastre, J.V. ; Nuño, L. ; Bort, M. ; de los Reyes, E.
Author_Institution :
Member, Departamento de Comunicaciones, E.T.S.I. Telecomunicación, Universidad Politécnica de Valencia, Cno de Vera s/n 46071 Valencia. Phone: 34-6-3877306, FAX: 34-6-3877309
Abstract :
The EMS inside slotted screens has been studied by using a hybrid technique. The screen is characterized, using the FEM, by a generalized admittance or impedance matrix, from which the scattering matrix can be straightforwardly obtained. The scattering matrix is then combined with a modal solution to compute the fields inside and outside the envelope. This circuital approach provides a systematic procedure for the analysis of very complex open structures.
Keywords :
Admittance; Boundary conditions; Circuits; Dielectric losses; Dielectric materials; Electromagnetic scattering; Magnetic analysis; Magnetic fields; Sparse matrices; Strontium;
Conference_Titel :
Microwave Conference, 1997. 27th European
Conference_Location :
Jerusalem, Israel
DOI :
10.1109/EUMA.1997.337854
