• DocumentCode
    2134163
  • Title

    Susceptibility Analysis of Arbitrarily Shaped 2-D Dielectric Screens using the Generalized Scattering Matrix Method

  • Author

    Balbastre, J.V. ; Nuño, L. ; Bort, M. ; de los Reyes, E.

  • Author_Institution
    Member, Departamento de Comunicaciones, E.T.S.I. Telecomunicación, Universidad Politécnica de Valencia, Cno de Vera s/n 46071 Valencia. Phone: 34-6-3877306, FAX: 34-6-3877309
  • Volume
    1
  • fYear
    1997
  • fDate
    8-12 Sept. 1997
  • Firstpage
    523
  • Lastpage
    531
  • Abstract
    The EMS inside slotted screens has been studied by using a hybrid technique. The screen is characterized, using the FEM, by a generalized admittance or impedance matrix, from which the scattering matrix can be straightforwardly obtained. The scattering matrix is then combined with a modal solution to compute the fields inside and outside the envelope. This circuital approach provides a systematic procedure for the analysis of very complex open structures.
  • Keywords
    Admittance; Boundary conditions; Circuits; Dielectric losses; Dielectric materials; Electromagnetic scattering; Magnetic analysis; Magnetic fields; Sparse matrices; Strontium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1997. 27th European
  • Conference_Location
    Jerusalem, Israel
  • Type

    conf

  • DOI
    10.1109/EUMA.1997.337854
  • Filename
    4138895
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2134163