DocumentCode
2134577
Title
An optimal approach with genetic algorithm for thermal performance of heat sink/TEC assembly
Author
Peng, C.H. ; Wu, M.C. ; Horng, J.T. ; Lee, C.Y. ; Fang, C.J. ; Hung, Y.H.
Author_Institution
Dept. of Power Mech. Eng., National Tsing Hua Univ., Hsinchu
fYear
2006
fDate
May 30 2006-June 2 2006
Lastpage
463
Abstract
In the present study, a semi-empirical method that combines theoretical and experimental data for exploring the thermal performance of a heat sink with or without integrating TEC has been successfully established. By employing the genetic optimization technique, a series of constrained optimal designs have been performed. The independent variables for optimization search are the pumping capacity of the TEC (Q c), the electric current of the TEC (I) and the external thermal resistance between hot side of the TEC and ambient (Rext ). The present objective for the optimization search is the maximum temperature difference between heat sinks with and without integrating TEC. The results show that optimal value of DeltaTb-c is 21.3degC, with boundary limits of Qc =10W, I=10A and Rext=0.25 degC/W. However, this design results in a poor coefficient of performance (COP), say COP=0.17. Under a given constraint of COPsquare2, the optimal value of DeltaTb-c can be obtained to be 9.1 degC with the corresponding Qc=14.8W, I=3.4A and Rext=0.25degC/W. Comparisons between the results by the present optimal design and those obtained by the semi-empirical method have been made with a satisfactory agreement. The present optimal design shows that a heat sink/TEC assembly can provide an effective temperature reduction with high COP and extend the upper limits of air-cooled heat sinks
Keywords
assembling; genetic algorithms; heat sinks; thermal management (packaging); 10 A; 10 W; 14.8 W; 21.3 C; 3.4 A; 9.1 C; TEC assembly; air-cooled heat sinks; electric current; external thermal resistance; genetic algorithm; genetic optimization; heat sink assembly; temperature reduction; thermal performance; Assembly; Electric resistance; Genetic algorithms; Heat engines; Heat sinks; Temperature; Thermal conductivity; Thermal engineering; Thermal management of electronics; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
Conference_Location
San Diego, CA
ISSN
1087-9870
Print_ISBN
0-7803-9524-7
Type
conf
DOI
10.1109/ITHERM.2006.1645379
Filename
1645379
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