DocumentCode
2134750
Title
Embedded thermoelectric coolers for semiconductor hot spot cooling
Author
Koester, David ; Venkatasubramanian, Rama ; Conner, Bob ; Snyder, G.Jeffrey
Author_Institution
Nextreme Thermal Solutions, Research Triangle Park, NC
fYear
2006
fDate
May 30 2006-June 2 2006
Firstpage
491
Lastpage
496
Abstract
Advanced semiconductors continue to increase performance by increasing functional integration and clock speed. Not only is the total power consumption increasing, the power distribution is highly non-uniform over the die area. Continued reduction in design rules are likely to increase the non-uniformity of the power density as high-speed circuits that dissipate a large amount of power but consume a small amount of die area are surrounded by lower-speed circuits that dissipate little power but consume a larger die area. The high temperature of localized hot spots adversely affects product reliability, performance and yield. A promising approach for site-specific cooling of hot spots is use of an embedded thermoelectric cooler (eTEC). The thickness of superlattice thermoelectric material is typically less than 20 mum, which provides very high heat flux (>300 W/cm2). The eTEC can be unobtrusively integrated in the package between the die and heat spreader. On-demand, site-specific cooling and the high coefficient-of-performance (COP) of the eTEC minimize the active power required for cooling hot spots
Keywords
cooling; semiconductor device packaging; semiconductor superlattices; thermal management (packaging); thermoelectric devices; embedded thermoelectric coolers; heat flux; heat spreader; high-speed circuits; localized hot spots; lower-speed circuits; power density; power distribution; semiconductor hot spot cooling; superlattice thermoelectric material; Circuits; Clocks; Cooling; Energy consumption; Energy management; Subthreshold current; Temperature dependence; Thermal management; Thermoelectricity; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
Conference_Location
San Diego, CA
ISSN
1087-9870
Print_ISBN
0-7803-9524-7
Type
conf
DOI
10.1109/ITHERM.2006.1645384
Filename
1645384
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