Title :
The Determination of On-Wafer Noise Parameters at W-Band
Author :
Alam, Tariq A. ; Pollard, Roger D. ; Snowden, Christopher M.
Author_Institution :
Institute of Microwaves and Photonics, School of Electronic and Electrical Engineering, The University of Leeds, Leeds LS2 9JT, UK. TEL: +44 113 233 2094 FAX: +44113 233 2032, E-Mail: eentam@sun.leeds.ac.uk
Abstract :
A new procedure for determining the noise parameters of on-wafer devices at W-band is presented. In this procedure the noise parameters of the device (DUT) are de-embedded using correlation matrices. The first reported noise parameter results for an on-wafer attenuator at 94GHz are also presented. These measured noise parameters show good agreement to those calculated from the DUT´s scattering parameters.
Keywords :
Calibration; Equations; Isolators; Noise figure; Noise measurement; Probes; Scattering parameters; Switches; Transmission line matrix methods; Tuners;
Conference_Titel :
Microwave Conference, 1997. 27th European
Conference_Location :
Jerusalem, Israel
DOI :
10.1109/EUMA.1997.337873
