DocumentCode
2135103
Title
Design and Realization of an On-Wafer Two Port Transfer Standard
Author
Madonna, GianLuigi ; Ferrero, Andrea ; Pisani, Umberto
Author_Institution
Dipartimento di Elettronica, Politecnico di Torino, Corso Duca degli Abnrzzi 24, 10129 Torino. Italy
Volume
2
fYear
1997
fDate
8-12 Sept. 1997
Firstpage
692
Lastpage
696
Abstract
Among the different techniques for the network analyser calibration, the authors recently introduced the NR procedure based on the concept of transfer standard, characterised by primary laboratories. The paper presents the theory assumed to properly design that standard and some experimental results to verify the accuracy obtained by this calibration.
Keywords
Calibration; Electronic mail; Measurement standards; Measurement techniques; Network topology; Passive networks; Reflectivity; Scattering parameters; Testing; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1997. 27th European
Conference_Location
Jerusalem, Israel
Type
conf
DOI
10.1109/EUMA.1997.337874
Filename
4138926
Link To Document