DocumentCode :
2135103
Title :
Design and Realization of an On-Wafer Two Port Transfer Standard
Author :
Madonna, GianLuigi ; Ferrero, Andrea ; Pisani, Umberto
Author_Institution :
Dipartimento di Elettronica, Politecnico di Torino, Corso Duca degli Abnrzzi 24, 10129 Torino. Italy
Volume :
2
fYear :
1997
fDate :
8-12 Sept. 1997
Firstpage :
692
Lastpage :
696
Abstract :
Among the different techniques for the network analyser calibration, the authors recently introduced the NR procedure based on the concept of transfer standard, characterised by primary laboratories. The paper presents the theory assumed to properly design that standard and some experimental results to verify the accuracy obtained by this calibration.
Keywords :
Calibration; Electronic mail; Measurement standards; Measurement techniques; Network topology; Passive networks; Reflectivity; Scattering parameters; Testing; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1997. 27th European
Conference_Location :
Jerusalem, Israel
Type :
conf
DOI :
10.1109/EUMA.1997.337874
Filename :
4138926
Link To Document :
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