DocumentCode :
2135357
Title :
State of the art Integrated InGaP/GaAs HBT-DRO with -124 dBc/Hz at 6.7 GHz
Author :
Perez, S. ; Floriot, D. ; Maurin, Ph. ; Bouquet, Ph. ; Gutierrez, P.M. ; Obregon, J. ; Delage, S.L.
Author_Institution :
Universidad de Salamanca. Departamento de Fisica Aplicada; Plaza de la Merced s/n 37001 Salamanca - Spain
Volume :
2
fYear :
1997
fDate :
8-12 Sept. 1997
Firstpage :
745
Lastpage :
748
Abstract :
We report on the design of an ultra-low noise GaInP/ GaAs HBT DRO working at 6.7 GHz. Experimental results give a PM noise of - 124 dBc/Hz at 10 kHz off-carrier. A comparison has been performed with a SiBJT DRO using strictly the same oscillator topology. We obtain at least 14 dB improvement wit HBT DRO, demonstrating the superiority of the HBT to produce high quality low phase noise microwave sources.
Keywords :
Capacitance; Circuit topology; Coupling circuits; Dielectric substrates; Frequency; Gallium arsenide; Heterojunction bipolar transistors; Oscillators; Phase noise; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1997. 27th European
Conference_Location :
Jerusalem, Israel
Type :
conf
DOI :
10.1109/EUMA.1997.337883
Filename :
4138935
Link To Document :
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