Title :
Characterizing the Dependability of Distributed Storage Systems Using a Two-Layer Hidden Markov Model-Based Approach
Author :
Chen, Xin ; Warren, James ; Han, Fang ; He, Xubin
Author_Institution :
Dept. of Electr. & Comput. Eng., Tennessee Technol. Univ., Cookeville, TN, USA
Abstract :
Nowadays, dependability is of paramount importance in modern distributed storage systems. A challenging issue to deploy a storage system with certain dependability requirements or improve existing systems´ dependability is how to comprehensively and efficiently characterize the dependability of those systems. In this paper, we present a two-layer Hidden Markov Model (HMM) to characterize the dependability of a distributed storage system, focusing on the layer of parallel file system. By training the model with observable measurements under faulty scenarios, such as I/O performance, we quantify the system dependability via a tuple of state transition probability, service degradation, and fault latency under those scenarios. Our experimental results on a distributed storage system with PVFS (Parallel Virtual File System) demonstrate the effectiveness of our HMM-based approach, which efficiently captures the behavior patterns of the target system under disk faults and memory overusage.
Keywords :
distributed processing; hidden Markov models; probability; storage management; HMM model; PVFS; distributed storage system; fault latency; hidden Markov model-based approach; parallel file system; parallel virtual file system; service degradation; state transition probability; Computational modeling; Computers; Degradation; Hidden Markov models; Maximum likelihood decoding; Stochastic processes; Training; dependability; distributed storage systems; hidden markov model;
Conference_Titel :
Networking, Architecture and Storage (NAS), 2010 IEEE Fifth International Conference on
Conference_Location :
Macau
Print_ISBN :
978-1-4244-8133-0
DOI :
10.1109/NAS.2010.28