• DocumentCode
    2135552
  • Title

    Tele-nanorobotics using atomic force microscope

  • Author

    Sitti, Metin ; Hashimoto, Hideki

  • Author_Institution
    Inst. of Ind. Sci., Tokyo Univ., Japan
  • Volume
    3
  • fYear
    1998
  • fDate
    13-17 Oct 1998
  • Firstpage
    1739
  • Abstract
    A tele-nanorobotics system using an atomic force microscope (AFM) as the nanorobot has been proposed. Modeling and control of the AFM cantilever, and modeling of nanometer scale forces have been realized for telemanipulation applications. Besides 3-D virtual reality visual feedback in the user interface, a 1 DOF haptic device has been constructed for nano scale haptic sensing. For feeling the nano forces, a bilateral teleoperation control system with virtual impedance approach has been introduced. Initial experiments and simulations on the AFM and teleoperation system show that the system can be utilized for different tele-nanomanipulation applications such as 2-D nano particle assembly or biological object manipulation
  • Keywords
    atomic force microscopy; force control; haptic interfaces; micromanipulators; nanotechnology; telerobotics; virtual reality; 1 DOF haptic device; 2D nano particle assembly; 3D virtual reality visual feedback; atomic force microscope; bilateral teleoperation control system; biological object manipulation; cantilever; nano scale haptic sensing; nanometer scale forces; tele-nanorobotics system; virtual impedance approach; Atomic force microscopy; Biological system modeling; Control systems; Feedback; Force control; Haptic interfaces; Impedance; Nanobioscience; User interfaces; Virtual reality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Robots and Systems, 1998. Proceedings., 1998 IEEE/RSJ International Conference on
  • Conference_Location
    Victoria, BC
  • Print_ISBN
    0-7803-4465-0
  • Type

    conf

  • DOI
    10.1109/IROS.1998.724849
  • Filename
    724849