DocumentCode
2135552
Title
Tele-nanorobotics using atomic force microscope
Author
Sitti, Metin ; Hashimoto, Hideki
Author_Institution
Inst. of Ind. Sci., Tokyo Univ., Japan
Volume
3
fYear
1998
fDate
13-17 Oct 1998
Firstpage
1739
Abstract
A tele-nanorobotics system using an atomic force microscope (AFM) as the nanorobot has been proposed. Modeling and control of the AFM cantilever, and modeling of nanometer scale forces have been realized for telemanipulation applications. Besides 3-D virtual reality visual feedback in the user interface, a 1 DOF haptic device has been constructed for nano scale haptic sensing. For feeling the nano forces, a bilateral teleoperation control system with virtual impedance approach has been introduced. Initial experiments and simulations on the AFM and teleoperation system show that the system can be utilized for different tele-nanomanipulation applications such as 2-D nano particle assembly or biological object manipulation
Keywords
atomic force microscopy; force control; haptic interfaces; micromanipulators; nanotechnology; telerobotics; virtual reality; 1 DOF haptic device; 2D nano particle assembly; 3D virtual reality visual feedback; atomic force microscope; bilateral teleoperation control system; biological object manipulation; cantilever; nano scale haptic sensing; nanometer scale forces; tele-nanorobotics system; virtual impedance approach; Atomic force microscopy; Biological system modeling; Control systems; Feedback; Force control; Haptic interfaces; Impedance; Nanobioscience; User interfaces; Virtual reality;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Robots and Systems, 1998. Proceedings., 1998 IEEE/RSJ International Conference on
Conference_Location
Victoria, BC
Print_ISBN
0-7803-4465-0
Type
conf
DOI
10.1109/IROS.1998.724849
Filename
724849
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