Title :
Performance of turbo codes with two-branch receive diversity and correlated fading
Author :
Ohtsuki, Tomoaki ; Kalm, J.M.
Author_Institution :
Dept. of Electr. Eng., Sci. Univ. of Tokyo, Japan
Abstract :
We analyze the effects of fading correlation on the performance of turbo codes with two-branch receive diversity combining schemes. We use transfer function bounding techniques to obtain upper bounds on the bit error rate (BER) for maximum-likelihood (ML) decoding of turbo codes constructed with uniform interleavers. We apply the techniques to parallel concatenated coding (PCC) schemes with two-branch receive diversity. We present the average bounds on the BER for two cases: (a) fully interleaved channels with channel state information (CSI) and (b) Rayleigh fading channels with fading perfectly correlated in time. We show that as the fades in the two antennas become more correlated, the BER improvement obtained by increasing the block size N becomes larger. We also show that the effects of fading correlation for maximal ratio combining (MRC) and for equal gain combining (EGC) are almost identical, while those for selection combining (SC) are much more pronounced than for these two techniques
Keywords :
Rayleigh channels; antenna arrays; channel coding; concatenated codes; diversity reception; error statistics; land mobile radio; maximum likelihood decoding; turbo codes; BER; EGC; ML decoding; Rayleigh fading channels; antennas; bit error rate; channel state information; correlated fading; equal gain combining; fading correlation; fully interleaved channels; maximal ratio combining; maximum-likelihood decoding; parallel concatenated coding; selection combining; transfer function bounding; turbo codes; two-branch receive diversity; uniform interleaver; upper bounds; Bit error rate; Concatenated codes; Diversity reception; Fading; Maximum likelihood decoding; Performance analysis; Rayleigh channels; Transfer functions; Turbo codes; Upper bound;
Conference_Titel :
Vehicular Technology Conference Proceedings, 2000. VTC 2000-Spring Tokyo. 2000 IEEE 51st
Conference_Location :
Tokyo
Print_ISBN :
0-7803-5718-3
DOI :
10.1109/VETECS.2000.851280