• DocumentCode
    21368
  • Title

    Superlens-Based Nanoscale Imaging

  • Author

    Mandal, Srimanta

  • Author_Institution
    Central Mech. Eng. Res. Inst., Durgapur, India
  • Volume
    33
  • Issue
    2
  • fYear
    2014
  • fDate
    March-April 2014
  • Firstpage
    17
  • Lastpage
    20
  • Abstract
    Since the discovery of the superlens (a lens that uses metamaterials to go beyond the diffraction limit), optical imaging for nanometer-sized objects has become possible. A superlens basically aids in the resolution improvement of an image, which is the primary essence to observe subwavelength features (in the nanometer range). The subwavelength features are missed in conventional optical imaging systems due to the diffraction limit of light. In the 21st century, various methods have been proposed to conduct nano-imaging using superlenses. This article provides a basic insight of nano-imaging using superlenses, various problems and limitations in nanovision, and the latest improvements in research.
  • Keywords
    image resolution; lenses; light diffraction; optical images; optical metamaterials; diffraction limit; image resolution; metamaterial; nanometer-sized object; nanovision; optical imaging system; superlens-based nanoscale imaging; Image resolution; Lenses; Nanoscale devices; Optical diffraction; Optical imaging; Optical surface waves;
  • fLanguage
    English
  • Journal_Title
    Potentials, IEEE
  • Publisher
    ieee
  • ISSN
    0278-6648
  • Type

    jour

  • DOI
    10.1109/MPOT.2013.2282165
  • Filename
    6757046