DocumentCode
21368
Title
Superlens-Based Nanoscale Imaging
Author
Mandal, Srimanta
Author_Institution
Central Mech. Eng. Res. Inst., Durgapur, India
Volume
33
Issue
2
fYear
2014
fDate
March-April 2014
Firstpage
17
Lastpage
20
Abstract
Since the discovery of the superlens (a lens that uses metamaterials to go beyond the diffraction limit), optical imaging for nanometer-sized objects has become possible. A superlens basically aids in the resolution improvement of an image, which is the primary essence to observe subwavelength features (in the nanometer range). The subwavelength features are missed in conventional optical imaging systems due to the diffraction limit of light. In the 21st century, various methods have been proposed to conduct nano-imaging using superlenses. This article provides a basic insight of nano-imaging using superlenses, various problems and limitations in nanovision, and the latest improvements in research.
Keywords
image resolution; lenses; light diffraction; optical images; optical metamaterials; diffraction limit; image resolution; metamaterial; nanometer-sized object; nanovision; optical imaging system; superlens-based nanoscale imaging; Image resolution; Lenses; Nanoscale devices; Optical diffraction; Optical imaging; Optical surface waves;
fLanguage
English
Journal_Title
Potentials, IEEE
Publisher
ieee
ISSN
0278-6648
Type
jour
DOI
10.1109/MPOT.2013.2282165
Filename
6757046
Link To Document