DocumentCode :
2137028
Title :
Dynamic response of a portable electronic product subjected to an impact load
Author :
Sharan, Kallolimath ; Lahoti, Sachin ; Zhou, Jiang
Author_Institution :
Dept. of Mech. Eng., Lamar Univ., Beaumont, TX
fYear :
2006
fDate :
May 30 2006-June 2 2006
Firstpage :
1049
Lastpage :
1055
Abstract :
In today´s world, hand held electronic products are becoming more and more popular. It is not uncommon that these electronic products accidentally drop on the ground. The accidental shock or impact load on these products leads to breakage of circuitry inside printed circuit board (PCB) which may cause malfunction or total failure of the product. Manufacturers usually determine the fragility of such products by conducting experimental drop tests, which are not only expensive but also time consuming. An alternative approach is to develop analytical dynamic model and to perform numerical simulations. In this paper, the drop impact response of the mobile phone is investigated. We decoupled this problem to be a two-step analysis. First, finite elemental analysis is used to determine the stiffness for the housing and the PCB. Second, the predictive dynamic model method is developed to investigate the drop impact response of the system. Parameter studies have been done on the basis of performed analysis. An engineering guideline for preliminary selection of the mass and stiffness of housing are developed, so that dynamic stability is maintained. Time and frequency response has been performed to study the peak acceleration, maximum displacement in the portable electronic product. Finally, the developed model is applied to evaluate dynamic response of commercially used mobile phone
Keywords :
electronic products; fracture toughness; impact strength; impact testing; mobile handsets; portable computers; printed circuits; reliability; PCB; drop test; dynamic response; dynamic stability; finite elemental analysis; hand held electronic products; impact load; mobile phone; modal analysis; portable electronic product; printed circuit board; Analytical models; Circuit testing; Electric shock; Finite element methods; Manufacturing; Mobile handsets; Numerical simulation; Performance analysis; Predictive models; Printed circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
Conference_Location :
San Diego, CA
ISSN :
1087-9870
Print_ISBN :
0-7803-9524-7
Type :
conf
DOI :
10.1109/ITHERM.2006.1645460
Filename :
1645460
Link To Document :
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