DocumentCode
2137105
Title
Development of an adaptive observer algorithm using RMS signal
Author
So, Byeong-kwan ; Kim, Jung-Han
Author_Institution
Dept. of Nano, Seoul Nat. Univ. of Sci. & Technol., Seoul, South Korea
fYear
2011
fDate
11-15 April 2011
Firstpage
163
Lastpage
169
Abstract
Because of recent progress of nano positioning technology, the feature of low vibration in controlling a stage has received great attention. In lithography process, the stage hunting directly affects the performance of the manufactured product. The stage perturbation results from various noise sources, and actually the statistical characteristics of the noises easily changes. This paper focused on the design of a novel state observer which filters out the random noises that cause stage vibration, and simultaneously maintains fast detection against external disturbances. The proposed algorithm was designed to use the RMS signal in the feedback loop of the position controller, and it continually measures the level of noises and adjusts the statistical parameters in the digital Kalman filter. The RMS signal is measured by a RMS convertor chip for fast filter performance, and an air levitated precision stage with linear voice coil motor (LVCM) was used for the experiment. The results show that the performance of the system is effectively improved by the proposed observer algorithm with a conventional PID controller.
Keywords
adaptive Kalman filters; adaptive control; feedback; observers; position control; three-term control; PID controller; RMS convertor chip; RMS signal; adaptive observer algorithm; air levitated precision stage; digital Kalman filter; feedback loop; linear voice coil motor; position controller; random noise filtration; stage vibration; state observer design; Kalman filters; Noise; Noise measurement; Observers; Semiconductor device measurement; Sensors; Simulation; Kalman filter; LVCM; RMS; precision stage;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence in Control and Automation (CICA), 2011 IEEE Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-9902-1
Type
conf
DOI
10.1109/CICA.2011.5945761
Filename
5945761
Link To Document