Title :
Two-port scalar microwave network analyzer with an analog source and software error correction
Author :
Kawalec, Artur ; Erricolo, Danilo
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
Abstract :
A computer controlled analog microwave sweep generator is developed for the use of scalar network analysis. The RF source is based on a free running voltage-controlled oscillator (VCO) which is being tuned by a precision digital-to-analog converter (DAC) in an open loop configuration. A switched directional coupler assembly is implemented to allow for the measurement of the magnitudes of S21 and S11 parameters. Also, a low cost RF power detector is used to measure the power of the transmitted and reflected waves. The system is controlled by a windows based application which plots the S-parameters vs. frequency. Tests show that such a low cost approach combined with the advantages of software control and error correction, provides a low cost solution for making broadband microwave measurements.
Keywords :
S-parameters; analogue computer circuits; assembling; computerised instrumentation; digital-analogue conversion; directional couplers; microwave generation; microwave measurement; microwave oscillators; network analysers; voltage-controlled oscillators; DAC; RF power detector; RF source; S11 parameters; S21 parameters; VCO; analog source; broadband microwave measurements; computer controlled analog microwave sweep generator; cost approach; open loop configuration; precision digital-to-analog converter; reflected waves; running voltage-controlled oscillator; scalar network analysis; software control; software error correction; switched directional coupler assembly; two-port scalar microwave network analyzer; Antenna measurements; Microwave oscillators; Power measurement; Radio frequency; Software; Transmission line measurements; Voltage measurement;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4673-0461-0
DOI :
10.1109/APS.2012.6348424