DocumentCode
2137618
Title
Zero reflection phenomenon in terahertz crystalline spectra
Author
Felinskyi, S.G. ; Felinskyi, G.S.
Author_Institution
Taras Shevchenko Kyiv Nat. Univ., Kiev, Ukraine
fYear
2013
fDate
9-13 Sept. 2013
Firstpage
189
Lastpage
191
Abstract
Research results of deep minima reflectance of terahertz (far-infrared) radiation one may observe experimentally in a number of crystalline media are firstly presented in the paper. Analysis of physical conditions for the almost complete disappearance of the electromagnetic waves reflection from the interface with crystal is given. We based on single oscillatory model of crystal and it allows us to derive the quantitative expressions for the frequency corresponds to minimum value of the reflection coefficient Rmin. It is shown the frequencies where the reflection intensity riches extremely low values are always greater than the appropriate frequencies of longitudinal vibrations, and Rmin = 0 for an ideal case of damping absence. Two models of the crystalline medium are considered: (i) the ideal case without damping and (ii) real model corresponds to the case of nonzero phonon damping. The applicability of both models for describing the phenomenon of zero reflection of terahertz waves is established by comparing the calculations results together and by its matching with actual experimental data.
Keywords
electromagnetic wave reflection; phonons; terahertz wave spectra; deep minima reflectance; longitudinal vibrations; nonzero phonon damping; reflection coefficient; single oscillatory model; terahertz; terahertz crystalline spectra; zero reflection phenomenon; Crystals; Damping; Media; Phonons; Reflection; Reflection coefficient; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Optoelectronics and Lasers (CAOL), 2013 International Conference on
Conference_Location
Sudak
ISSN
2160-1518
Print_ISBN
978-1-4799-0016-9
Type
conf
DOI
10.1109/CAOL.2013.6657573
Filename
6657573
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