Title :
Extraction of human behavior from human activity monitoring data using MEMS sensors
Author :
Nii, Manabu ; Nakai, Kazuki ; Takahashi, Yutaka
Abstract :
To record daily activity for well-maintained human health care, a monitoring system based on multiple microelectromechanical systems (MEMS) has been developed. Several kinds of numerical data of subject´s activity can be stored using the MEMS based monitoring system. When we use subject´s activity on a single day, a huge volume of data is obtained and recorded. In order to estimate the subject´s behavior from such a huge volume data, we propose a behavior estimation method which consists of a SVM and a fuzzy rule based system. Our proposed method consists of two steps of abstraction. First, action primitives are defined and a SVM based classification system is generated from sample numerical data of action primitives or human knowledge. Then, the SVM classifies a part of numerical data into each action primitive. Therefore, numerical data are expressed by a sequence of action primitives. Next, a fuzzy rule which maps a sequence of actions onto a behavior is defined by human user for each behavior. In the second-step abstraction, each action sequence is expressed as a behavior by using the defined fuzzy rules. From the results of the abstraction, we can estimate the subject´s state.
Keywords :
bioMEMS; fuzzy set theory; health care; microsensors; patient monitoring; pattern classification; support vector machines; MEMS based monitoring system; MEMS sensor; SVM based classification system; behavior estimation method; fuzzy rule based system; human activity monitoring data; human behavior extraction; human health care; human user; multiple microelectromechanical system; numerical data; second-step abstraction; subject activity; Humans; Micromechanical devices; Monitoring; Prototypes; Sensor systems; Support vector machines; MEMS sensors; SVM; behavior estimation; fuzzy;
Conference_Titel :
Robotic Intelligence In Informationally Structured Space (RiiSS), 2011 IEEE Workshop on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-9885-7
DOI :
10.1109/RIISS.2011.5945784