Title :
Error probabilities of an FFT-based FFH/BFSK linear-combining receiver with partial-band noise jamming and AWGN
Author :
Teh, Kah C. ; Kot, Alex C. ; Li, Kwok H.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Abstract :
This paper presents the performance analysis of a fast frequency-hopped binary frequency-shift-keying (FFH/BFSK) linear-combining receiver in conjunction with a fast Fourier transform (FFT) processor. Under the conditions of partial-band noise jamming (PBNJ) and additive white Gaussian noise (AWGN), the bit-error rate (BER) expressions of the proposed FFT-based linear-combining receiver are derived in terms of the characteristic functions of the decision statistics. The BER expressions, validated by simulation results, are applicable to any arbitrary diversity level. The proposed FFT-based receiver provides an alternative to the conventional matched-filter receiver. The FFT-based receiver is shown to give comparable performance with the corresponding matched-filter receiver. The worst-case PBNJ fraction is shown to be inversely proportional to the signal-to-jamming ratio and the performance of the FFT-based linear-combining receiver is degraded as the diversity level is increased
Keywords :
AWGN; diversity reception; error statistics; fast Fourier transforms; frequency hop communication; frequency shift keying; jamming; radio receivers; spread spectrum communication; AWGN; BER; FFH/BFSK linear-combining receiver; FFT processor; FFT-based linear-combining receiver; additive white Gaussian noise; bit-error rate; characteristic functions; decision statistics; diversity level; error probabilities; fast Fourier transform; fast frequency-hopped binary frequency-shift-keying; matched-filter receiver; partial-band noise jamming; performance analysis; signal-to-jamming ratio; simulation results; spread spectrum communications; AWGN; Additive white noise; Bit error rate; Error probability; Fast Fourier transforms; Frequency; Gaussian noise; Jamming; Performance analysis; Statistics;
Conference_Titel :
Vehicular Technology Conference Proceedings, 2000. VTC 2000-Spring Tokyo. 2000 IEEE 51st
Conference_Location :
Tokyo
Print_ISBN :
0-7803-5718-3
DOI :
10.1109/VETECS.2000.851358