• DocumentCode
    2138079
  • Title

    Temperature and bias effects in high resistivity silicon substrates

  • Author

    Reyes, A.C. ; El-Ghazaly, S.M. ; Dorn, S. ; Dydyk, M.

  • Author_Institution
    Motorola Inc., Tempe, AZ, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    87
  • Abstract
    The purpose of this paper is to report the results of studies dealing with the impact of temperature and DC bias on low-cost low loss high resistivity (HR) Si substrate. Measured results show that microwave performance of a coplanar transmission lines and a meander inductive structure realized on HR Si are not affected by applied DC bias from -10 V to 10 V in the temperature range from -50/spl deg/C to 50/spl deg/C. Furthermore, measured results demonstrate that the losses of the structures under study on HR Si are comparable to the losses of similar structures on semi-insulating (SI) GaAs up to 100/spl deg/C.
  • Keywords
    coplanar waveguides; elemental semiconductors; losses; microwave integrated circuits; silicon; -10 to 10 V; -50 to 50 degC; DC bias; Si; bias effects; coplanar transmission lines; high resistivity substrates; losses; meander inductive structure; microwave performance; Conductivity; Coplanar waveguides; Dielectric loss measurement; Dielectric measurements; Frequency; Gallium arsenide; Loss measurement; Probes; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1996., IEEE MTT-S International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3246-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1996.508469
  • Filename
    508469