Measurements and performance of a microstrip beam probe system

Microstrip probes and associated processing electronics have been designed and used to measure charged-beam position, angle, intensity, output phase, and energy. The authors describe the system that uses the probes and discuss typical beam-cavity interaction data, measurement errors, and system performance. As a bunched, charged beam periodically passes through a microstrip probe, a bipolar signal proportional to the beam´s current and position is induced into each of the probe´s four axial symmetric lobes. Processing electronics and computer algorithms transform two probe signals into beam intensity and into centroids of the six-dimensional, phase-space beam distributions. These beam centroids can then be plotted with cavity data so that output beam characteristics can be expressed as a function of cavity power and phase.<>