Title :
Experimental and theoretical study of parasitic leakage/resonance in a K/Ka-Band MMIC package(003) 5336168
Author :
Yook, J.G. ; Katehi, L.P.B. ; Simons, Rainee N. ; Shalkhauser, K.
Author_Institution :
Radiat. Lab., Michigan Univ., Ann Arbor, MI, USA
Abstract :
In this paper, electromagnetic leakage and spurious resonances in a K/Ka-band (18-40 GHz) MMIC hermetic package designed for a phase shifter chip are studied using the finite element method (FEM) and the numerical simulation results are compared with measured data. Both in measured and calculated data several spurious resonances are observed in the 18 to 24 GHz region and the origin of this phenomenon is identified by virtue of the modeling capability of the FEM.
Keywords :
MMIC phase shifters; finite element analysis; integrated circuit packaging; 18 to 40 GHz; K-band; Ka-band; MMIC hermetic package; finite element method; numerical simulation; parasitic electromagnetic leakage; phase shifter chip; spurious resonances; Computational modeling; Electromagnetic measurements; Electromagnetic radiation; Frequency; MMICs; NASA; Packaging; Phase shifters; Resonance; Semiconductor device measurement;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.508498
