• DocumentCode
    2138853
  • Title

    Investigation of MMIC flip chips with sealants for improved reliability without hermeticity

  • Author

    Sturdivant, R. ; Quan, C. ; Wooldridge, J.

  • Author_Institution
    Radar & Commun. Syst., Hughes Aircraft Co., El Segundo, CA, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    239
  • Abstract
    As a result of the advantages they offer, MMIC flip chips are being developed for airborne radar applications. Some of the benefits of this technology are lower wafer processing cost when Coplanar Waveguide (CPW) is used as the transmission line, surface mount compatibility, repeatable low inductance interconnect, self-alignment due to solder surface tension, very high reliability, and robust 25 mil thick chips. These benefits result in lower manufacturing cost at the chip and module level, higher quality, and increased reliability. A series of recent experiments indicate that this technology may also allow for the use of sealants which provide chip protection at a fraction of the cost of welding or seam sealing at the module level. We have investigated the use of flip chips with sealants and show measured results for GaAs MMIC flip chips operating in the 5-15 GHz range which use sealants for environmental protection.
  • Keywords
    MMIC; coplanar waveguides; environmental testing; flip-chip devices; integrated circuit packaging; integrated circuit reliability; seals (stoppers); 25 mil; 5 to 15 GHz; CPW; GaAs; MMIC flip chips; airborne radar applications; chip protection; coplanar waveguide; environmental protection; glob top; low inductance interconnect; manufacturing cost; module level; reliability; sealants; sealguard; self alignment; solder surface tension; surface mount compatibility; Airborne radar; Coplanar transmission lines; Coplanar waveguides; Costs; Flip chip; MMICs; Protection; Sealing materials; Surface waves; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1996., IEEE MTT-S International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3246-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1996.508502
  • Filename
    508502