• DocumentCode
    2138989
  • Title

    Low temperature fluxless flip chip technology for fine pitch bonding

  • Author

    Davoine, C. ; Fendler, M. ; Marion, F. ; Louis, C. ; Fortunier, R.

  • Author_Institution
    CEA Grenoble
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    This paper describes a flip chip technology representing a technological breakthrough compared with conventional method such as soldering or the bonding through conductive adhesives. Electrical connections are performed by the insertion of metallic micro-tips in ductile solder material. As low temperature and fluxless technology, this method is adapted to fine pitch and large devices. Here we present our technological investigations to perform electrical conductive micro-tips such as plasma etching, chemical etching, lift-off, and an innovated use of nanoimprint technology of metallic materials. Gold appears as a good choice of material for micro-tips performing, because an intermetallic phase is formed with solder materials such as tin, lead, or indium based solder and ensures the mechanical and electrical contact. Finally we present the bonding results of our test vehicle which validate the principle of the electrical connection through insertion for a 15mum pitch. The resistance value of such a connection has also been measured for a 30mum pitch
  • Keywords
    bonding processes; electrical contacts; fine-pitch technology; flip-chip devices; soldering; 15 micron; 30 micron; chemical etching; ductile solder material; electrical connections; electrical contact; fine pitch bonding; fluxless flip chip technology; intermetallic phase; lift-off technique; low temperature technology; mechanical contact; metallic microtips; nanoimprint technology; plasma etching; solder materials; Bonding; Chemical technology; Conducting materials; Conductive adhesives; Etching; Flip chip; Inorganic materials; Plasma applications; Plasma temperature; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645621
  • Filename
    1645621