Title :
Modeling-based printed electronics characterization
Author :
Mäkinen, R. ; Rasku, A. ; Sillanpää, H.
Author_Institution :
Dept. of Electron., Tampere Univ. of Technol., Tampere, Finland
Abstract :
A wide-band characterization process for printed electronics materials is presented. A parallelized 2-D eigenmode solver is developed and successfully applied to extract actual material parameter values from measurements. This information is critical for both process development and modeling-based design.
Keywords :
conductors (electric); coplanar waveguides; eigenvalues and eigenfunctions; nanoelectronics; coplanar waveguide; modeling-based design; modeling-based printed electronics characterization; nanoparticle conductors; parallelized 2D eigenmode solver; printed electronics materials; thin printed conductors; wideband characterization process; Calibration; Conductors; Dielectric loss measurement; Materials; Permittivity; Permittivity measurement;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4673-0461-0
DOI :
10.1109/APS.2012.6348498
