• DocumentCode
    2139659
  • Title

    Fabrication and performance of separately-biasable antiparallel-pair "T-anode" mixer diodes employing a compact multiple-layer integrated bias circuit at 210 GHz

  • Author

    Lee, T.-H. ; Humphrey, D.A. ; Dengler, R.J. ; Mehdi, I. ; Martin, S.C. ; Pease, A. ; Oswald, J.E. ; Smith, R.P. ; Siegel, P.H.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    381
  • Abstract
    A 210 GHz waveguide subharmonically-pumped mixer with integrated antiparallel-pair planar "T-anode" Schottky diodes and a novel compact multiple-layer bias circuit has successfully fabricated and measured. The anodes are defined by electron-beam lithography using technology similar to that employed for T-gate transistors. A compact multiple-layer filter structure provides individual biasing capability for each diode, which reduces the required local oscillator power for subharmonic mixing. Unbiased, a DSB mixer noise temperature of 1420 K was achieved with 6.4 mW of required LO power. Using separate diode bias to reduce the required LO power to 3.2 mW, the noise temperature increased slightly to 1640 K. This is the lowest noise temperature reported for a separately biased mixer at this frequency.
  • Keywords
    Schottky diode mixers; millimetre wave diodes; millimetre wave mixers; waveguide components; 210 GHz; 3.2 to 6.4 mW; EHF; Schottky diodes; T-anode mixer diodes; electron-beam lithography; fabrication; individual biasing capability; multiple-layer filter structure; multiple-layer integrated bias circuit; separately-biasable antiparallel-pair; subharmonic mixing; waveguide subharmonically-pumped mixer; Anodes; Fabrication; Filters; Integrated circuit measurements; Integrated circuit technology; Lithography; Noise reduction; Planar waveguides; Schottky diodes; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1996., IEEE MTT-S International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3246-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1996.508535
  • Filename
    508535