• DocumentCode
    2139954
  • Title

    Grain features of SnAgCu solder and their effect on mechanical behaviour of micro-joints

  • Author

    Gong, Jicheng ; Liu, Changqing ; Conway, Paul P. ; Silberschmidt, Vadim V.

  • Author_Institution
    Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ.
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    SnAgCu alloy, which promises compatible properties with Sn-Pb solder, has been identified as one of the most potential Lead-free solders for electronic interconnections. However, due to the miniaturization of solder joints, a micro-joint of this material contains only few grains. In this case, the mechanical behaviour of solder alloys shifts from the polycrystal-based to single-crystal based. Since P-Sn, the matrix of SnAgCu solder, has a contracted body-centred tetragonal structure, its grains are expected to have anisotropic properties, which are important, the reliability of a micro-joint. The present paper studies the inelastic anisotropic behaviour of this material. In order to analyse the effect of grain features, solder joints at different size are formed under the different cooling rate. An in-situ shear test is then performed to correlate the mechanical behavior of a joint to its microstructural features. The results show that the decrease in the joint´s dimension results in the diminishment of the number of grains, and that the inelastic behaviour of SnAgCu grains is orientation-dependent
  • Keywords
    cooling; copper alloys; grain size; mechanical testing; shear strength; silver alloys; solders; tin alloys; SnAgCu; electronic interconnections; grain features; inelastic anisotropic behaviour; lead-free solders; mechanical behaviour; microjoints behaviour; shear test; solder alloys; Anisotropic magnetoresistance; Assembly; Cooling; Joining materials; Lead; Soldering; Temperature; Testing; Thermal expansion; Thermal loading;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645655
  • Filename
    1645655