• DocumentCode
    2140225
  • Title

    Integral relations for bipolar transistor modelling-rigorous results

  • Author

    Reisch, M.

  • Author_Institution
    Siemens AG, Munchen, West Germany
  • fYear
    1988
  • fDate
    11-14 Dec. 1988
  • Firstpage
    126
  • Lastpage
    129
  • Abstract
    It is shown how current-spreading, current-driven generalization/recombination phenomena, transient effects, and series-resistance effects can rigorously be considered within integral relations characterizing bipolar transistor behavior such as H.K. Grummel´s (1970) integral charge control relation. The proposed approach applies concepts that reestablish a vanishing divergence of the transfer current and allows the derivation of consistent, closed-form expressors for the base and collector current of a three-dimensional BJT (bipolar junction transistor) of arbitrary geometry. The approach provides in particular a rigorous definition of electron current transit time in terms of AC quantities that reduces to the quasistatic definition in the limit as omega approaches 0.<>
  • Keywords
    bipolar transistors; semiconductor device models; Grummel integral charge control relation; base current; bipolar junction transistor; bipolar transistor modelling; closed-form expressors; collector current; current-driven generalization/recombination phenomena; current-spreading; electron current transit time; integral relations; series-resistance effects; transfer current; transient effects; Analytical models; Bipolar transistors; Character generation; Electron emission; Geometry; Integral equations; Laboratories; Microelectronics; Research and development; Spontaneous emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1988.32769
  • Filename
    32769